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首页> 外文期刊>Journal of Crystal Growth >Impact of the gas flow ratio on the physical properties of GaN grown by vertical flow metalorganic chemical vapour deposition
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Impact of the gas flow ratio on the physical properties of GaN grown by vertical flow metalorganic chemical vapour deposition

机译:气体流量比对垂直流金属有机化学气相沉积法生长的GaN物理性能的影响

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摘要

We studied the effect of gas flow ratio of the H_2 carrier gas to the NH_3 precursor on the physical and crystal properties of GaN. GaN was grown by vertical reactor metalorganic chemical vapour deposition (MOCVD) on a low-temperature-deposited GaN buffer layer. A (0 0 0 1) sapphire substrate was used. The impact of the gas flow ratio as it was varied from 0.25 to 1 was investigated and discussed. With increase in flow ratio, the concentrations of magnesium and carbon impurities in GaN increased. The flow ratio of 0.5 is the optimum value to minimise the background electron concentration and to maintain crystal quality. The decrease in the background electron concentration is due to the compensation mechanism of acceptor-like magnesium and carbon impurities.
机译:我们研究了H_2载气与NH_3前驱体的气体流量比对GaN物理和晶体性质的影响。通过在低温沉积的GaN缓冲层上进行垂直反应器金属有机化学气相沉积(MOCVD)来生长GaN。使用(0 0 0 1)蓝宝石衬底。研究并讨论了气体流量比在0.25到1之间变化的影响。随着流量的增加,GaN中镁和碳杂质的浓度增加。 0.5的流量比是最小化背景电子浓度并保持晶体质量的最佳值。背景电子浓度的降低归因于受体样镁和碳杂质的补偿机制。

著录项

  • 来源
    《Journal of Crystal Growth》 |2010年第15期|P.2239-2242|共4页
  • 作者单位

    Department of Electrical and Electronic Engineering, Chung Cheng Institute of Technology, National Defense University, Tahsi, Taoyuan 335, Taiwan, ROC;

    rnDepartment of Electrical and Electronic Engineering, Chung Cheng Institute of Technology, National Defense University, Tahsi, Taoyuan 335, Taiwan, ROC;

    rnDepartment of Electrical and Electronic Engineering, Chung Cheng Institute of Technology, National Defense University, Tahsi, Taoyuan 335, Taiwan, ROC;

    rnMaterials and Electro-Optics Research Division, Chung Shan Institute of Science and Technology, Taoyuan 325, Taiwan, ROC;

    rnMaterials and Electro-Optics Research Division, Chung Shan Institute of Science and Technology, Taoyuan 325, Taiwan, ROC;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A1. Background electron concentration; A1. Carrier gas; A3. MOCVD; B2. GaN;

    机译:A1。背景电子浓度;A1。载气A3。 MOCVD;B2。氮化镓;

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