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Influence of Sn and Mn on structural, optical and magnetic properties of spray pyrolysed CdS thin films

机译:Sn和Mn对喷雾热解CdS薄膜结构,光学和磁性的影响

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摘要

Sn, Mn-doped CdS thin films were deposited using on glass substrates at 400℃ in air atmosphereby chemical spray pyrolysis method. X-ray Diffraction (XRD) of the deposited film exhibits the cubicphase of CdS with a preferred orientation along the (111) plane. The average crystallite size (D) ofpure CdS (18 nm), Sn:CdS (7 nm) and Mn:CdS (6 nm) thin films are calculated. The morphologicalvariations due to the incorporation of Sn and Mn in CdS thin films observed by the Scanningelectron microscopy (SEM) images. Incorporation of Sn and Mn confirmed from Energy dispersive Xrayspectroscopy (EDAX). Sn and Mn-doped CdS thin films show a significant blue shift in theabsorption spectrum. From the optical studies, The optical bandgap values are 2.43 eV (CdS),2.28 eV (Mn:CdS) and 2.03 eV (Sn:CdS) respectively. Advanced magnetic saturation and coercivityhave been studied for the doped CdS thin films. Consequently, the obtained results will lead tobetter performance for the optoelectronic and spintronic applications.
机译:在空气中,通过化学喷雾热解法,在400℃的玻璃基板上沉积了Sn,Mn掺杂的CdS薄膜。沉积膜的X射线衍射(XRD)表现出CdS的立方相,并具有沿(111)平面的最佳取向。计算纯CdS(18 nm),Sn:CdS(7 nm)和Mn:CdS(6 nm)薄膜的平均微晶尺寸(D)。通过扫描电子显微镜(SEM)图像观察到由于CdS薄膜中掺入了Sn和Mn而引起的形态变化。通过能量色散X射线光谱法(EDAX)证实了Sn和Mn的结合。锡和锰掺杂的CdS薄膜在吸收光谱中显示出明显的蓝移。根据光学研究,光学带隙值分别为2.43 eV(CdS),2.28 eV(Mn:CdS)和2.03 eV(Sn:CdS)。已经对掺杂的CdS薄膜进行了高级磁饱和和矫顽力的研究。因此,所获得的结果将为光电和自旋电子应用带来更好的性能。

著录项

  • 来源
    《Materials Research Innovations》 |2020年第2期|82-86|共5页
  • 作者单位

    Department of Physics Bharathidasan University Tiruchirappalli India;

    Department of Physics Tagore Engineering College Chennai India;

    Department of Studies and Research in Industrial Chemistry School of Chemical Sciences Kuvempu University Shankaragatta India.;

    Department of Chemistry NIE Institute of Technology Mysuru Karnataka India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CdS thin films; XRD; SEM with EDAX; VSM studies;

    机译:CdS薄膜;XRD;扫描电镜与EDAX;VSM研究;

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