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Infrared thermographic test for removing background reflection based on polarization theory

机译:基于偏振理论的红外热像测试消除背景反射

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摘要

The infrared thermographic test is often influenced by the environment, which sometimes causes false defect detection. Thus, the background reflection from sunlight or neighboring structures is a serious problem. In the present study, we solve this problem by quantitatively separating the background reflection and the defects by using the polarization theory for dielectrics. The proposed program can remove the background reflection and obtain a thermal image including only the emitted energy from the defect part. According to the experimental results, we establish a reflection removal infrared thermographic test using the polarization theory for dielectrics.
机译:红外热成像测试通常受环境影响,有时会导致错误的缺陷检测。因此,来自阳光或邻近结构的背景反射是一个严重的问题。在本研究中,我们使用电介质的极化理论通过定量分离背景反射和缺陷来解决此问题。所提出的程序可以去除背景反射并获得仅包括来自缺陷部分的发射能量的热图像。根据实验结果,我们使用极化理论对电介质建立了反射消除红外热成像测试。

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