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The photocurrent-voltage characteristic simulated of resonant tunneling photodiodes

机译:共振隧穿光电二极管的光电流-电压特性模拟

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摘要

The resonant tunneling photodiodes based on an AlGaAs/GaAs double barrier structure with an InGaAs absorption layer have simulated. Photons with the wavelength λ= 1.54 μm lead to hole accumulation close to the double barrier inducing a voltage shift of the current-voltage curve which strongly depends on the bias voltage. It was found that the peak current shifting to high voltage as the temperature decreased. In addition, the capacity-voltage (C-V) characteristic was simulated under different work temperatures and results showed the higher capacitance gotten at low bias (about 0.3 V) and room temperature.
机译:模拟了基于AlGaAs / GaAs双势垒结构和InGaAs吸收层的共振隧穿光电二极管。波长为λ= 1.54μm的光子导致空穴积累接近双势垒,从而引起电流-电压曲线的电压偏移,该电压偏移主要取决于偏置电压。发现随着温度降低峰值电流移向高压。此外,在不同的工作温度下对电容-电压(C-V)特性进行了仿真,结果表明,在低偏压(约0.3 V)和室温下可获得更高的电容。

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