Optical properties of thin films of poly(methyl--phenylsilylene)

K. Navratil; J. Sik; J. Humlicek

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Optical properties of thin films of poly(methyl--phenylsilylene)

机译：聚（甲基-苯基亚甲硅烷基）薄膜的光学性质

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We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence re- flectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from l to 7 eV. This optical database is listed in tabular form. Four absorption bands are clearly observable in the range below 7 eV. We have also performed a comparison with the transmission data from solutions.

机译：我们报告了使用浇铸和旋涂技术在单晶硅和熔融石英衬底上制备的聚（甲基-苯基亚甲硅烷基）薄膜的光学研究结果。从接近法线入射的反射率，我们确定了在1至7 eV的能量间隔内，复数介电函数和复数折射率的光谱依赖性。该光学数据库以表格形式列出。在低于7 eV的范围内，可以明显观察到四个吸收带。我们还对解决方案中的传输数据进行了比较。

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来源
《Optical Materials》 |1999年第1期|p.105-113|共9页
作者
K. Navratil; J. Sik; J. Humlicek;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类工程材料学;
关键词
Poly(methyl--phenyl)silylene; Thin film; Dielectric;

机译：聚（甲基-苯基）亚甲硅烷基;薄膜;电介质;

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Optical properties of thin films of poly(methyl--phenylsilylene)

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