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Structural characterization of tetrahexyl sexithiophene ordered films grown by organic molecular beam deposition

机译：通过有机分子束沉积生长的四己基六噻吩有序薄膜的结构表征

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摘要

The deposition of thin films of 3,3,4,3-tetrahexyl-2,2:5,2:5,2:5,2:5,2-sexithiophene (4H6T) has been performed in ultra-high vacuum conditions by using organic molecular beam deposition (OMBD). Once temperature and pressure are optimized, the substrate choice is the key factor in determining the properties of the deposited films. From the structural analysis of samples deposited on different inorganic and organic substrates as well as from the comparison with crystalline polymorphs of 4H6T, useful information for the control of both structural order and molecular orientation in the films are inferred. The results of structural investigations by X-ray diffraction, compared with optical analyses (electronic absorption and photoluminescence), are indicative of either intermolecular or sub- strate-4H6T interactions.
机译：3,3,4,3-四己基-2,2：5,2：5,2：5,2：5,2-sexithiophene（4H6T）的薄膜沉积已在超高真空条件下通过使用有机分子束沉积（OMBD）。优化温度和压力后，选择基材是决定沉积膜性能的关键因素。从沉积在不同无机和有机基质上的样品的结构分析，以及与4H6T晶体多晶型物的比较，推断出可用于控制膜中结构顺序和分子取向的有用信息。与光学分析（电子吸收和光致发光）相比，通过X射线衍射进行结构研究的结果表明分子间或底物4H6T相互作用。

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