X-ray diffraction profiles from axial nanowire heterostructures

V. M. Kaganer; M. Woelz; O. Brandt; L. Geelhaar; H. Riechert

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X-ray diffraction profiles from axial nanowire heterostructures

机译：轴向纳米线异质结构的X射线衍射图

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X-ray diffraction peaks from nanowires with quantum disks inserted to form axial heterostructures are studied theoretically and experimentally. The peak profiles are calculated taking into account partial coherence of the x-ray beam, the orientational distribution of nanowires, their length distribution, fluctuations of the layer thicknesses, and microstrain. We show on the example of In_xGa_(1-x)N/GaN superlattices that the common ω-2θ symmetric Bragg scans with a laboratory diffractometer provide the determination of superstructure periods, quantum well thicknesses, and In concentrations. The proposed method allows us to study the nanowire structures in the same manner as it is commonly done for planar heterostructures.

机译：理论上和实验上研究了纳米线插入量子盘形成轴向异质结构的X射线衍射峰。计算峰轮廓时要考虑到X射线束的部分相干性，纳米线的取向分布，其长度分布，层厚度的波动以及微应变。我们在In_xGa_（1-x）N / GaN超晶格的示例中表明，使用实验室衍射仪进行的常见ω-2θ对称Bragg扫描可确定上层结构周期，量子阱厚度和In浓度。所提出的方法使我们能够以与平面异质结构通常相同的方式研究纳米线结构。

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来源
《Physical review》 |2011年第24期|p.245321.1-245321.9|共9页
作者
V. M. Kaganer; M. Woelz; O. Brandt; L. Geelhaar; H. Riechert;
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作者单位

Paul-Drude Institut fuer FestkB.83erperelektrB.83nik, HausvB.83gteiplatz 5-7, DE-10117 Berlin, Germany;

Paul-Drude Institut fuer FestkB.83erperelektrB.83nik, HausvB.83gteiplatz 5-7, DE-10117 Berlin, Germany;

Paul-Drude Institut fuer FestkB.83erperelektrB.83nik, HausvB.83gteiplatz 5-7, DE-10117 Berlin, Germany;

Paul-Drude Institut fuer FestkB.83erperelektrB.83nik, HausvB.83gteiplatz 5-7, DE-10117 Berlin, Germany;

Paul-Drude Institut fuer FestkB.83erperelektrB.83nik, HausvB.83gteiplatz 5-7, DE-10117 Berlin, Germany;

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superlattices;

机译：超晶格;

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1. High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction [J] . Susanna Hammarberg, Vilgaile Dagyte, Lert Chayanun, 纳米研究：英文版 . 2020,第009期

机译：使用扫描X射线衍射对单个轴向异质结构纳米线进行高分辨率应变映射
2. High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction [J] . Susanna Hammarberg, Lincoln J.Lauhon, Magnus T.Borgstr(o)m, 纳米研究（英文版） . 2020,第009期

机译：使用扫描X射线衍射对单个轴向异质结构纳米线进行高分辨率应变映射
3. Strain and x-ray diffraction from axial nanowire heterostructures [J] . V. M. Kaganer, A. Yu. Belov Physical review . 2012,第12期

机译：轴向纳米线异质结构的应变和X射线衍射
4. Modeling the comosition of ternary III-V nanowires and axial nanowire heterostructures [C] . A. A. Koryakin, V. Zannier, F. Rossi, International Conference on Laser Optics . 2018

机译：模拟三元III-V纳米线和轴向纳米线异质结构的组成
5. Simulating Irradiation-Induced Dislocation Loops in Zirconium Alloys: Understanding Their Structure, Formation and Effect on X-ray Diffraction Line Profiles [D] . Hulse, Rory. 2019

机译：模拟锆合金中的辐照引起的位错环：了解其结构，形成以及对X射线衍射线轮廓的影响
6. X-ray diffraction strain analysis of a single axial InAs1–xPx nanowire segment [O] . Mario Keplinger, Bernhard Mandl, Dominik Kriegner, -1

机译：单轴向InAs1-xPx纳米线段的X射线衍射应变分析
7. X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment. [O] . Keplinger, Mario, Mandl, Bernhard, Kriegner, Dominik, 2015

机译：单轴Inas1-xpx纳米线段的X射线衍射应变分析。

X-ray diffraction profiles from axial nanowire heterostructures

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