首页> 外文期刊>Plasma physics and controlled fusion >The first results of O-ICR experiments to remove re-deposited layers and hydrogen in the HT-7 superconducting tokamak
【24h】

The first results of O-ICR experiments to remove re-deposited layers and hydrogen in the HT-7 superconducting tokamak

机译:O-ICR实验的初步结果是去除HT-7超导托卡马克中的再沉积层和氢

获取原文
获取原文并翻译 | 示例
           

摘要

Oxidation experiments associated with ion cyclotron resonance discharges (O-ICR) have been performed in HT-7 in the presence of a permanent magnetic field of 1.5-2.0 T. The influence of ICRH power and filling pressure on hydrogen and carbon removal rates was analysed. Total numbers of 5.70 x 10(22) H-atorns, 1.6 x 10(22) D-atoms and 2.35 x 10(22) C-atoms had been removed within eight O-ICR cleanings. An similar to 20.5 mn co-deposited film on average was removed from the limiters and liners with an area of 12 m(2). About 1.73 x 10(22) O-atom retention in an O-ICR experiment corresponds to a coverage of 1.44 x 10(16)O cm(-2). The highest removal rates of H, D and C-atoms of up to 2.64 x 10(22) atoms h(-1), 7.76 x 10(21) atoms h(-1) and 1.49 x 10(22) atoms h(-1), respectively, were obtained in a 40kW, 9 x 10(-2) Pa O-ICR cleaning, corresponding to a removal rate of co-deposits of about 317nm/day (7.2g/day for carbon). In a 50min He-ICR cleaning after the O-ICR experiment about 5.39 x 10(21) oxygen retention was removed. Also the influence of the oxidation experiment on the subsequent plasma operation was studied. Normal plasma discharges could be recovered after a few hours of disruptive plasma discharges.
机译:在存在1.5-2.0 T永久磁场的情况下,在HT-7中进行了与离子回旋共振放电(O-ICR)相关的氧化实验。分析了ICRH功率和填充压力对氢和碳去除率的影响。在八次O-ICR清洗中,总共去除了5.70 x 10(22)个H原子,1.6 x 10(22)个D原子和2.35 x 10(22)个C原子。从限幅器和衬板中平均移除了面积约为12 m(2)的平均类似于20.5百万的共沉积膜。 O-ICR实验中约1.73 x 10(22)的O原子保留量对应于1.44 x 10(16)O cm(-2)的覆盖范围。 H,D和C原子的最高去除率高达2.64 x 10(22)个原子h(-1),7.76 x 10(21)个原子h(-1)和1.49 x 10(22)个原子h( -1)分别通过40kW,9 x 10(-2)Pa的O-ICR清洗获得,对应的共沉积去除速率约为317nm /天(碳为7.2g /天)。在O-ICR实验后的50分钟He-ICR清洁中,除去了约5.39 x 10(21)的氧气保留。还研究了氧化实验对后续等离子体操作的影响。几个小时的破坏性等离子体放电后,即可恢复正常的等离子体放电。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号