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Towards automated diffraction tomography: Part I-Data acquisition

机译:走向自动衍射层析成像:第一部分-数据采集

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摘要

The ultimate aim of electron diffraction data collection for structure analysis is to sample the reciprocal space as accurately as possible to obtain a high-quality data set for crystal structure determination. Besides a more precise lattice parameter determination, fine sampling is expected to deliver superior data on reflection intensities, which is crucial for subsequent structure analysis. Traditionally, three-dimensional (3D) diffraction data are collected by manually tilting a crystal around a selected crystallographic axis and recording a set of diffraction patterns (a tilt series) at various crystallographic zones. In a second step, diffraction data from these zones are combined into a 3D data set and analyzed to yield the desired structure information. Data collection can also be performed automatically, with the recent advances in tomography acquisition providing a suitable basis. An experimental software module has been developed for the Tecnai microscope for such an automated diffraction pattern collection while tilting around the goniometer axis. The module combines STEM imaging with diffraction pattern acquisition in nanodiffraction mode. It allows automated recording of diffraction tilt series from nanoparticles with a size down to 5 nm.
机译:用于结构分析的电子衍射数据收集的最终目的是尽可能准确地采样倒数空间,以获得用于晶体结构确定的高质量数据集。除了可以更精确地确定晶格参数外,精细采样还有望提供有关反射强度的出色数据,这对于后续的结构分析至关重要。传统上,通过手动将晶体绕选定的晶体学轴倾斜并记录一组衍射图样(倾斜序列)在各个晶体学区域来收集三维(3D)衍射数据。在第二步中,将来自这些区域的衍射数据合并为3D数据集并进行分析,以生成所需的结构信息。数据收集也可以自动进行,而层析成像采集的最新进展提供了合适的基础。已经为Tecnai显微镜开发了一个实验软件模块,用于在绕测角计轴倾斜时自动收集衍射图样。该模块将STEM成像与纳米衍射模式下的衍射图样采集相结合。它允许自动记录尺寸小于5 nm的纳米颗粒的衍射倾斜序列。

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