...
首页> 外文期刊>Technical physics letters: Letters to the Russian journal of applied physics >Structural Properties of the Epitaxial (SiC)_(1 - x)(AlN)_x Solid Solution Films Fabricated by Magnetron Sputtering of SiC-Al Composite Targets
【24h】

Structural Properties of the Epitaxial (SiC)_(1 - x)(AlN)_x Solid Solution Films Fabricated by Magnetron Sputtering of SiC-Al Composite Targets

机译:磁控溅射SiC-Al复合靶材制备的外延(SiC)_(1-x)(AlN)_x固溶膜的结构性质

获取原文
获取原文并翻译 | 示例
           

摘要

Epitaxial layers of the (SiC)_(1 - x)(AlN)_x solid solution with x ≈ 0.12 and x = 0.64 without macroscopic structural distortions were grown using a new technique. It was established that the compositional dependences of crystal lattice parameters of the epitaxial films obey the Vegard's law with an error of ~0.03. This confirms that there is formation of isomorphic substitutional solid solutions in the SiC-AlN system.
机译:使用新技术生长了(SiC)_(1-x)(AlN)_x固溶体的外延层,其中x≈0.12,x = 0.64,没有宏观的结构变形。已经确定,外延膜的晶格参数的组成依赖性服从Vegard定律,误差为〜0.03。这证实了在SiC-AlN系统中形成了同构替代固溶体。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号