The Multimeter at the Nanoscale: Charge transport at the nanoscale measured by a multi-tip scanning probe microscope

Bert Voigtlander; Vasily Cherepanov; Peter Coenen

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The Multimeter at the Nanoscale: Charge transport at the nanoscale measured by a multi-tip scanning probe microscope

机译：纳米级的万用表：通过多尖端扫描探针显微镜测量的纳米级电荷传输

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A multi-tip scanning tunneling microscope (STM) specifically designed for charge transport measurements at the nanoscale is described. Complementing the instrument with a versatile measurement electronics creates a powerful tool to give insight into fundamental transport properties at the nanoscale. We demonstrate the capabilities of the instrument by measuring resistance profiles along freestanding GaAs nanowires, by the acquisition of nanoscale potential maps, and by the identification of an anisotropy in the surface conductivity at a silicon surface.

机译：描述了一种专门设计用于纳米级电荷传输测量的多尖端扫描隧道显微镜（STM）。用通用的测量电子设备对仪器进行补充，可以创建功能强大的工具，从而洞悉纳米级的基本传输特性。我们通过测量沿独立式GaAs纳米线的电阻曲线，通过获取纳米级电势图以及通过识别硅表面的表面电导率各向异性来证明该仪器的功能。

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《Vakuum in Forschung und Praxis》 |2016年第3期|共5页
作者
Bert Voigtlander; Vasily Cherepanov; Peter Coenen;
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正文语种 eng
中图分类真空技术的应用;真空电子学（电子物理学）;
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1. The Multimeter at the Nanoscale: Charge transport at the nanoscale measured by a multi-tip scanning probe microscope [J] . Bert Voigtlander, Vasily Cherepanov, Peter Coenen Vakuum in Forschung und Praxis . 2016,第3期

机译：纳米级的万用表：通过多尖端扫描探针显微镜测量的纳米级电荷传输
2. Microscope for direct measurements of nanoscale properties: multi-tip scanning tunneling microscope [J] . Tomonobu Nakayama, Chun-Sheng Jiang, Taichi Okuda, 计测と制御 . 1999,第12期

机译：显微镜用于纳米级特性的直接测量：多尖扫描隧道显微镜
3. Modeling the nanoscale linear response of superconducting thin films measured by a scanning probe microwave microscope [J] . Tai Tamin, Ghamsari B.G., Anlage Steven M. Journal of Applied Physics . 2014,第20期

机译：模拟扫描探针微波显微镜测量的超导薄膜的纳米级线性响应
4. Electrical transport at the nanoscale: Scanning Spreading Resistance, Scanning Capacitance and Scanning Kelvin Probe [C] . Cuenat Alexandre, Muniz-Piniella Andres Conference on Precision Electromagnetic Measurements . 2014

机译：纳米级的电传输：扫描扩展电阻，扫描电容和扫描开尔文探针
5. Charge transport and contact effects in nanoscale electrical junctions formed via conducting probe atomic force microscopy. [D] . Beebe, Jeremy Matthew. 2005

机译：通过导电探针原子力显微镜形成的纳米级电结中的电荷传输和接触效应。
6. Nanoscale electrostatic gating of molecular transport through nuclear pore complexes as probed by scanning electrochemical microscopy [O] . Pavithra Pathirathna, Ryan J. Balla, Guanqun Meng, 2019

机译：纳米级静电门控分子通过核孔配合物的传输如通过扫描电化学显微镜探测的
7. Modeling the nanoscale linear response of superconducting thin films measured by a scanning probe microwave microscope [O] . Tai, Tamin, Ghamsari, B. G., Anlage, Steven M. 2014

机译：超导薄膜的纳米级线性响应建模用扫描探针微波显微镜测量
8. Scanning Probe Microscope for Ultra-High Resolution Nanoscale Electron and Near- [R] . Chou, S. Y. 1996

机译：扫描探针显微镜用于超高分辨率纳米级电子和近 -

The Multimeter at the Nanoscale: Charge transport at the nanoscale measured by a multi-tip scanning probe microscope

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