Stable solutions of the least square equation in determination of lattice parameters from pairs of X-ray diffraction lines

GUO Changlin; HUANG Yuehong

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Stable solutions of the least square equation in determination of lattice parameters from pairs of X-ray diffraction lines

机译：从成对的X射线衍射线确定晶格参数时最小二乘方程的稳定解

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The pair-line method for precise determination of the lattice parameter has more advantages than the routine methods in measuring absolute angle of lines. The experiment of the pair-line method by measuring the difference of angle δ_(ij) between twoangles θ_i and θ_j of diffraction lines is rather simple and convenient technically and is easy to obtain the accurate results and eliminate the systematic errors. Moreover, the precision requirement is not high for the X-ray apparatus and the measuring device.

机译：在测量线的绝对角度时，用于精确确定晶格参数的双线方法比常规方法具有更多优势。通过测量衍射线的两个角度θ_i和θ_j之间的角度δ_（ij）的差来进行双线方法的实验相当简单，技术上也很方便，并且易于获得准确的结果并消除了系统误差。此外，对于X射线设备和测量装置的精度要求不高。

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来源
《Chinese science bulletin》 |1996年第15期|共6页
作者
GUO Changlin; HUANG Yuehong;
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正文语种 eng
中图分类自然科学现状及发展;
关键词
X-ray diffraction; pair-line method; lattice parameters; stable solution; least square equation;

机译：X射线衍射;成对线法;晶格参数;稳定解;最小二乘方程;

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专利

1. Stable solutions of the least square equation in determination of lattice parameters from pairs of X-ray diffraction lines [J] . GUO Changlin, HUANG Yuehong Chinese science bulletin . 1996,第15期

机译：从成对的X射线衍射线确定晶格参数时最小二乘方程的稳定解
2. Determination of lattice parameters, strain state and composition in semipolar III-nitrides using high resolution X-ray diffraction [J] . Frentrup Martin, Hatui Nirupam, Wernicke Tim, Journal of Applied Physics . 2013,第21期

机译：使用高分辨率X射线衍射测定半极性III型氮化物中的晶格参数，应变状态和组成
3. Determination of lattice parameters, strain state and composition in semipolar Ill-nitrides using high resolution X-ray diffraction [J] . Martin Frentrup, Nirupam Hatui, Tim Wernicke, Journal of Applied Physics . 2013,第21期

机译：使用高分辨率X射线衍射测定半极性I-氮化物的晶格参数，应变状态和组成
4. LATTICE PARAMETER DETERMINATIONS OF KNO3-NH4NO3 SOLIDSOLUTIONS BY X-RAY DIFFRACTION METHOD [C] . Wen-Ming Chien, Dhanesh Chandra, Jennifer Smith, TMS annual meeting . 2005

机译：X射线衍射法测定KNO3-NH4NO3固体的晶格参数。
5. PRECISION MEASUREMENTS OF THE LATTICE PARAMETER OF SOLID ARGON UNDER PRESSURE BY X-RAY DIFFRACTION. [D] . BRONSVELD, PAULUS MARIA. 1971

机译：X射线衍射在压力下对固体氩晶格参数的精密测量。
6. Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films [O] . Roland Resel, Markus Bainschab, Alexander Pichler, -1

机译：掠入射X射线衍射中的多次散射：对薄膜中晶格常数测定的影响
7. X-ray research of polycrystals. X-ray diffraction methods for precision determinations of polycrystal lattice parameters over unsolved double lines [O] . G. V. Davydov, V. P. Dzekanovskaya, N. A. Erokhov 1968

机译：多晶的X射线研究。 X射线衍射方法，用于在未解决的双线上进行精确测定多晶晶格参数
8. FIRESTAR A set of four programs for the evaluation of X-ray powder diffraction measurements and the derivation of crystal lattice parameters and FIRECRACKER a program for the calibration of X-ray powder diffractometers [R] . G. ASTLE, I. F. FERGUSON 1970

机译：FIREsTaR一套用于评估X射线粉末衍射测量和晶格参数推导的四个程序和一个用于校准X射线粉末衍射仪的程序FIRECRaCKER

Stable solutions of the least square equation in determination of lattice parameters from pairs of X-ray diffraction lines

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