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首页> 外文期刊>Journal of Microscopy >Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever
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Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever

机译：使用压阻微悬臂梁扫描近场光学显微镜的非光学尖端样本距离控制方法

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A piezoresistive micro cantilever is applied to monitor the displacement of an optical fibre probe and to control tip-sample distance. The piezoresistive cantilever was originally made for a self-sensitive atomic force microscopy (AFM) probe and has dimensions of 400 mum length, 50 mum width and 5 mum thickness with a resistive strain sensor at the bottom of the cantilever. We attach the piezoresistive cantilever tip to the upper side of a vibrating bent optical fibre probe and monitor the resistance change amplitude of the strain sensor caused by the optical fibre displacement. By using this resistance change to control the tip-sample distance, the two-cantilever system successfully provides topographic and near-field optical images of standard samples in a scanning near-field optical microscopy (SNOM)/AFM system. A resonant characteristic of the two-cantilever system is also simulated using a mechanical model, and the results of simulation correspond to the experimental results of resonance characteristics. [References: 11]
机译：压阻微悬臂梁可用于监测光纤探头的位移并控制尖端样品的距离。压阻悬臂最初是为自灵敏原子力显微镜（AFM）探针制造的，尺寸为400毫米长，50毫米宽和5毫米厚，在悬臂底部装有电阻应变传感器。我们将压阻悬臂尖端连接到振动弯曲的光纤探头的上侧，并监视由光纤位移引起的应变传感器的电阻变化幅度。通过使用这种电阻变化来控制尖端样品的距离，双悬臂系统成功地在扫描近场光学显微镜（SNOM）/ AFM系统中提供了标准样品的形貌和近场光学图像。还使用机械模型来模拟双悬臂系统的共振特性，并且仿真结果与共振特性的实验结果相对应。 [参考：11]

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