Twin-rainbow metrology. I. Measurement of the thickness of a thin liquid film draining under gravity

Charles L. Adler; James A. Lock; Ian P. Rafferty; Wayne Hickok

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Twin-rainbow metrology. I. Measurement of the thickness of a thin liquid film draining under gravity

机译：双彩虹计量。一，重力引流液膜厚度的测量

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We describe twin-rainbow metrology, a new optical technique used to measure the thickness of thin films in a cylindrical geometry. We also present an application of the technique: measurement of the thickness of a Newtonian fluid draining under gravity. We compare these measurements with fluid mechanics models.

机译：我们描述了双彩虹计量学，这是一种用于测量圆柱几何形状中的薄膜厚度的新光学技术。我们还介绍了该技术的一种应用：测量重力作用下排出的牛顿流体的厚度。我们将这些测量结果与流体力学模型进行比较。

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《Applied optics》 |2003年第33期|共11页
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Charles L. Adler; James A. Lock; Ian P. Rafferty; Wayne Hickok;
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1. Twin-rainbow metrology. I. Measurement of the thickness of a thin liquid film draining under gravity [J] . Charles L. Adler, James A. Lock, Ian P. Rafferty, Applied optics . 2003,第33期

机译：双彩虹计量。一，重力引流液膜厚度的测量
2. MEASUREMENTOFTHE MEAN FILM THICKNESS OF DYNAMIC SHEAR-DRIVEN THIN LIQUID FILMS USING OPTICAL INTERFEROMETRY [J] . M. A. Friedrich, H. Lan, N. E. Wilke Atomization and Sprays: Journal of the International Institutes for Liquid Atomization and Spray Systems . 2009,第7期

机译：光学干涉法测量动态剪切驱动薄液膜的平均膜厚
3. Droplet impact cavity film thickness measurements versus time after drop impact and cavity radius for thin static residual liquid layer thicknesses [J] . Kuhlman John M., Hillen Nicholas L. Experimental Thermal and Fluid Science: International Journal of Experimental Heat Transfer, Thermodynamics, and Fluid Mechanics . 2016,第Null期

机译：液滴冲击腔膜厚度测量值与液滴冲击后的时间和腔体半径之间的关系，以测定薄薄的静态残留液体层厚度
4. TiO2:Nb film thickness influences on the amorphous InGaZnO thin film transistors with Mo/TiO2:Nb source-drain electrodes [C] . Qingping Lin, Baozhu Chang, Letao Zhang, 2017 International Conference on Electron Devices and Solid-State Circuits . 2017

机译：TiO 2 ：Nb膜厚对具有Mo / TiO2：Nb源漏电极的非晶InGaZnO薄膜晶体管的影响
5. Design, development, and applications of image scanning ellipsometry for the measurement of thin film thickness profiles. [D] . Liu, An-Hong. 1994

机译：图像扫描椭圆仪的设计，开发和应用，用于测量薄膜厚度轮廓。
6. Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry [O] . Ahmad Razzaghi, Jafar Mostafavi Amjad, Maniya Maleki -1

机译：近轴自参考干涉法测量透明液膜的厚度
7. Thickness measurement of dynamic thin liquid films generated by plug-annular flow in non-wetting microchannels [O] . David C. Deisenroth -1

机译：在非润湿微通道中的插头环流产生动态薄液膜的厚度测量
8. ANALYSIS OF FILM THICKNESS EFFECT IN SLOW-SPEED LIGHTLY-LOADED ELASTO-HYDRODYNAMIC CONTACTS Part I. Development of Film Thickness Measurement Technique [R] . J. C. Tyler, R. D. Brown, H. J. Carper 1974

机译：慢速轻载弹性动力接触件薄膜厚度效应分析第一部分薄膜厚度测量技术的发展

Twin-rainbow metrology. I. Measurement of the thickness of a thin liquid film draining under gravity

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