Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer

首页> 外文期刊>Applied optics >Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer

【24h】

Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer

机译：用横向剪切，波长扫描干涉仪测量透明板的折射率和厚度的方法

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

A new method for measuring simultaneously the thickness and the refractive index of a transparent plate is proposed. The method is based on a simple, variable lateral-shear, wavelength-scanning interferometer. To achieve highly accurate measurements of both refractive index n and thickness d we use several means to determine these two quantities. We finely tune a distributed-feedback diode laser light source to introduce a phase shift into the detected signal, whereas we make the sample rotate to produce variable lateral shearing. Phase shifting permits precise determination of the optical thickness, nd, whereas refractive index n is obtained from the retrieved phase of the overall interference signal for all incidence angles.

机译：提出了一种同时测量透明板厚度和折射率的新方法。该方法基于简单的可变横向剪切波长扫描干涉仪。为了实现折射率n和厚度d的高精度测量，我们使用几种方法来确定这两个量。我们微调分布式反馈二极管激光光源，将相移引入到检测到的信号中，同时使样本旋转以产生可变的横向剪切。相移允许精确确定光学厚度nd，而折射率n是从所有入射角的总干涉信号的检索相位中获得的。

著录项

来源
《Applied optics》 |2003年第19期|共6页
作者

展开▼
作者单位

展开▼
收录信息
原文格式 PDF
正文语种 eng
中图分类
关键词

相似文献

外文文献
中文文献
专利

1. Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer [J] . Applied optics . 2003,第19期

机译：用横向剪切，波长扫描干涉仪测量透明板的折射率和厚度的方法
2. Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer [J] . Kenichi Hibino, Bozenko F. Oreb, Philip S. Fairman, Applied optics . 2004,第6期

机译：在波长扫描菲索干涉仪中同时测量透明平行板的表面形状和光学厚度的变化
3. Simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass plates using cyclic path optical configuration setup and a lateral shearing interferometer [J] . Y. Pavan Kumar, Sanjib Chatterjee Applied optics . 2012,第16期

机译：使用循环路径光学配置设置和横向剪切干涉仪同时测定中等厚度的平面平行透明玻璃板的折射率和厚度
4. Self-mix interferometer to measure transparent plates thickness and index of refraction [C] . Donati, S., Martini, G., Fathi, M.T. Sensors, 2011 IEEE . 2011

机译：自混合干涉仪可测量透明板的厚度和折射率
5. Dual interferometer system for measuring index of refraction . [D] . Goodwin, Eric Peter. 2007

机译：双干涉仪测量折射率。
6. Intra-observer and inter-observer repeatability of ocular surface interferometer in measuring lipid layer thickness [O] . Yang Zhao, Carin Lay San Tan, Louis Tong 2015

机译：眼表干涉仪的观察者内和观察者间重复性在测量脂质层厚度中的作用
7. Measuring residual stress in finite thickness plates using the hole-drilling method [O] . Marco Beghini, Leonardo Bertini, Anoj Giri, 2019

机译：使用空穴钻孔法测量有限厚度板中的残余应力
8. Measuring the Average Thickness of a Plate Using a Bayesian Method and Free Vibration Data. [R] . Moore, E. Z., Murphy, K. D., Nichols, J. M. 2011

机译：用贝叶斯方法和自由振动数据测量板的平均厚度。

Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer

摘要

著录项

相似文献

相关主题

期刊订阅