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Top-down fabrication of vertical silicon nano-rings based on Poisson diffraction

机译:基于泊松衍射的垂直硅纳米环的自顶向下制造

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Vertical Si nano-rings with a uniform thickness of about 100nm have been fabricated by conventional optical photolithography with a low cost based on Poisson diffraction. Moreover, the roughness of the Si nano-rings can be effectively reduced by sacrificial oxidation. In order to increase the density of the nano-rings, coaxial twin Si nano-rings have been fabricated by the Poisson diffraction method combined with the spacer technique. The thickness of both the inner and outer Si nano-rings is about 60nm, and the gap between the twin nano-rings is about 100nm
机译:基于泊松衍射的低成本的常规光学光刻技术已经制造了具有约100nm的均匀厚度的垂直Si纳米环。此外,可以通过牺牲氧化有效地减小Si纳米环的粗糙度。为了增加纳米环的密度,已经通过泊松衍射法结合间隔物技术制造了同轴双硅纳米环。内和外Si纳米环的厚度均为约60nm,双纳米环之间的间隙为约100nm

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