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Structural and optical properties of InGaN/GaN nanowire heterostructures grown by PA-MBE

机译:PA-MBE生长的InGaN / GaN纳米线异质结构的结构和光学性质

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The structural and optical properties of InGaN/GaN nanowire heterostructures grown by plasma-assisted molecular beam epitaxy have been studied using a combination of transmission electron microscopy, electron tomography and photoluminescence spectroscopy. It is found that, depending on In content, the strain relaxation of InGaN may be elastic or plastic. Elastic relaxation results in a pronounced radial In content gradient. Plastic relaxation is associated with the formation of misfit dislocations at the InGaN/GaN interface or with cracks in the InGaN nanowire section. In all cases, a GaN shell was formed around the InGaN core, which is assigned to differences in In and Ga diffusion mean free paths.
机译:通过结合透射电子显微镜,电子断层扫描和光致发光光谱研究了通过等离子体辅助分子束外延生长的InGaN / GaN纳米线异质结构的结构和光学性质。发现根据In含量,InGaN的应变松弛可以是弹性的或塑性的。弹性松弛导致明显的径向In含量梯度。塑性弛豫与InGaN / GaN界面处失配位错的形成或InGaN纳米线截面中的裂纹有关。在所有情况下,都会在InGaN核周围形成GaN壳层,这归因于In和Ga扩散平均自由程的差异。

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