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首页> 外文期刊>Nanotechnology >Dielectrophoretic investigation of Bi2Te3 nanowires-a microfabricated thermoelectric characterization platform for measuring the thermoelectric and structural properties of single nanowires
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Dielectrophoretic investigation of Bi2Te3 nanowires-a microfabricated thermoelectric characterization platform for measuring the thermoelectric and structural properties of single nanowires

机译：Bi2Te3纳米线的介电泳研究-用于测量单根纳米线的热电和结构性质的微制造热电表征平台

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摘要

In this article a microfabricated thermoelectric nanowire characterization platform to investigate the thermoelectric and structural properties of single nanowires is presented. By means of dielectrophoresis (DEP), a method to manipulate and orient nanowires in a controlled way to assemble them onto our measurement platform is introduced. The thermoelectric platform fabricated with optimally designed DEP electrodes results in a yield of nanowire assembly of approximately 90% under an applied peak-to-peak ac signal V-pp = 10 V and frequency f = 20 MHz within a series of 200 experiments. Ohmic contacts between the aligned single nanowire and the electrodes on the platform are established by electron beam-induced deposition. The Seebeck coefficient and electrical conductivity of electrochemically synthesized Bi2Te3 nanowires are measured to be -51 mu V K-1 and (943 +/- 160)/(Omega(-1) cm(-1)), respectively. Chemical composition and crystallographic structure are obtained using transmission electron microscopy. The selected nanowire is observed to be single crystalline over its entire length and no grain boundaries are detected. At the surface of the nanowire, 66.1 +/- 1.1 at.% Te and 34.9 +/- 1.1 at.% Bi are observed. In contrast, chemical composition of 64.2 at.% Te and 35.8 at.% Bi is detected in the thick center of the nanowire.
机译：在本文中，提出了一种微型热电纳米线表征平台，用于研究单纳米线的热电和结构特性。通过介电电泳（DEP），介绍了一种以受控方式操纵和定向纳米线以将其组装到我们的测量平台上的方法。在一系列200次实验中，在施加的峰峰值ac信号V-pp = 10 V和频率f = 20 MHz的情况下，使用优化设计的DEP电极制造的热电平台可产生约90％的纳米线组件。对齐的单纳米线与平台上的电极之间的欧姆接触是通过电子束诱导的沉积建立的。电化学合成的Bi2Te3纳米线的塞贝克系数和电导率经测量分别为-51μV K-1和（943 +/- 160）/（Omega（-1）cm（-1））。化学成分和晶体结构使用透射电子显微镜获得。观察到所选择的纳米线在其整个长度上是单晶的，并且没有检测到晶界。在纳米线的表面，观察到66.1 +/- 1.1原子％的Te和34.9 +/- 1.1原子％的Bi。相反，在纳米线的厚中心检测到64.2 at。％Te和35.8 at。Bi的化学成分。

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