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Enhanced radiative recombination and suppressed Auger process in semipolar and nonpolar InGaN/GaN quantum wells grown over GaN nanowires

机译:在GaN纳米线上生长的半极性和非极性InGaN / GaN量子阱中增强的辐射复合和抑制的俄歇过程

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摘要

The mechanism behind the improved light emission properties of semipolar and nonpolar InGaN/GaN multiple quantum wells (MQWs) conformally grown over n-GaN nanowires (NWs) was studied using variable-temperature photoluminescence and time-resolved photoluminescence (TRPL). A reduced internal polarization electric field was found to account for the observed enhancement in the radiative recombination rate and internal quantum efficiency of the MQWs on NWs. Additionally, the excitation-dependent TRPL results indicate a significantly depressed Auger recombination in MQWs grown on NWs that can be attributed to the feature of ultralow dislocation density of the MQWs grown over GaN nanostructures.
机译:使用可变温度光致发光和时间分辨光致发光(TRPL)研究了共形生长在n-GaN纳米线上(NWs)的半极性和非极性InGaN / GaN多量子阱(MQW)改善的发光特性的机理。发现减少的内部极化电场是观察到的量子阱在NW上的辐射复合率和内部量子效率提高的原因。此外,依赖于激发的TRPL结果表明,在NW上生长的MQW中,俄歇重组显着降低,这可归因于在GaN纳米结构上生长的MQW的位错密度超低。

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