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首页> 外文期刊>The journal of physical chemistry, A. Molecules, spectroscopy, kinetics, environment, & general theory >Interaction of scanning probes with semiconductor nanocrystals; physical mechanism and basis for near-field optical imaging
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Interaction of scanning probes with semiconductor nanocrystals; physical mechanism and basis for near-field optical imaging

机译：扫描探针与半导体纳米晶体的相互作用;近场光学成像的物理机制和基础

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摘要

We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in the proximity of metal and semiconducting atomic force microscope (AFM) tips. The presence of the tip alters the radiative decay rate of an emitter via interference and opens efficient nonradiative decay channels via energy transfer to the tip material. These effects cause quenching (or enhancement) of the emitter's PL intensity as a function of its distance from the interacting tip. We take advantage of this highly distance-dependent effect to realize a contrast mechanism for high-resolution optical imaging. AFM tips are optimized as energy acceptors by chemical functionalization with InAs NCs to achieve optical resolution down to 30 nm. The presented experimental scheme offers high-resolution optical information while maintaining the benefits of traditional AFM imaging. We directly measure the PL intensity of single NCs as a function of the tip distance. Our results are in good agreement with calculations made by a classical theoretical model describing an oscillating dipole interacting with a planar mirror.
机译：我们研究金属和半导体原子力显微镜（AFM）尖端附近的单个半导体纳米晶体量子点（NC）的光致发光（PL）的修改。尖端的存在通过干扰改变了发射器的辐射衰减率，并通过能量传输到尖端材料而打开了有效的非辐射衰减通道。这些效应导致发射器的PL强度淬灭（或增强），该强度取决于发射器与相互作用尖端的距离。我们利用这种高度依赖距离的效果来实现高分辨率光学成像的对比度机制。通过使用InAs NC进行化学功能化，将AFM尖端优化为能量受体，以实现低至30 nm的光学分辨率。提出的实验方案提供了高分辨率的光学信息，同时保持了传统AFM成像的优势。我们直接测量单个NC的PL强度作为尖端距离的函数。我们的结果与经典理论模型进行的计算非常吻合，经典理论模型描述了振荡偶极子与平面镜相互作用。

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