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The defect diffusion model, scaling, E_V*/H* and monomer volume and correlation lengths for glass-formers

机译:缺陷扩散模型,结垢,E_V * / H *以及玻璃形成剂的单体体积和相关长度

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摘要

Four topics are treated within the framework of the defect diffusion model (DDM). First, it is shown how the relationship between E_V*/H* (ratio of the apparent isochoric activation energy to the isobaric activation enthalpy) and monomer volume for polymers that has been pointed out by Floudas and co-workers [G. Floudas, K. Mpoukouvalas and P. Papadopoulos, J. Chem. Phys. 124 (2006) 074905] is predicted. Next, it is shown that in the DDM, scaling arises because the critical temperature can be represented approximately by a power law. Consequently, in the DDM scaling is always approximate and significant departures from scaling, as is observed in the case of hydrogen bonded materials for example, are matters of degree. It is also shown how the connection of scaling with E_V*/H* is a natural consequence of the DDM. Finally, DDM calculations of the defect correlation length are carried out and compared with experimental dynamical correlation lengths measured using the 4D3CP solid state NMR method.
机译:在缺陷扩散模型(DDM)的框架内处理了四个主题。首先,显示了Floudas和他的同事[E.V * / H *(表观等渗活化能与等压活化焓的比)与聚合物的单体体积之间的关系。 Floudas,K.Mpoukouvalas和P.Papadopoulos,J.Chem。物理124(2006)074905]。接下来,表明在DDM中会出现缩放,因为临界温度可以近似地由幂定律表示。因此,在DDM中,结垢始终是近似的,并且与结垢的明显偏离(例如在氢键材料的情况下观察到的)是程度的问题。还显示了将缩放与E_V * / H *连接是DDM的自然结果。最后,进行缺陷相关长度的DDM计算,并将其与使用4D3CP固态NMR方法测得的实验动态相关长度进行比较。

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