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首页> 外文期刊>Nanotechnology >Ultrafast exciton transfer in perovskite CsPbBr3 quantum dots and topological insulator Bi2Se3 film heterostructure
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Ultrafast exciton transfer in perovskite CsPbBr3 quantum dots and topological insulator Bi2Se3 film heterostructure

机译：UltraFast Exciton转移在Perovskite CSPBBR3量子点和拓扑绝缘子Bi2Se3膜异质结构

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摘要

Recently, topological insulator based heterostructures (HSs) have attracted tremendous research interest, due to their efficient carrier transfer features at the heterointerface induced by metallic surface states. Here, a novel HS comprising 0D perovskite CsPbBr3 quantum dots (QDs) and 2D material topological insulator Bi2Se3 film is proposed and experimentally investigated. Specifically, steady state and time-resolved photoluminescence (PL) measurements are employed, from which a significant quenching behaviour is observed in the HS, with an average quenching factor of 93.2 +/- 0.8%. Additionally, time-resolved PL spectroscopy affirms that the carrier transfer efficiency can be up to 92.6 +/- 0.2%. Furthermore, the dynamics of carrier transfer within the 0D-2D HS are characterized by utilizing femtosecond broadband transient absorption (TA) spectroscopy, revealing an ultrafast exciton transfer from photoexcited CsPbBr3 QDs to the Bi2Se3 film with a time-scale around 1.1 +/- 0.2 ps. An alternative important finding is that the band renormalization is exhibited in CsPbBr3 QDs of the HS, with the dominant factor being the Coulomb screening effect. This work is expected to provide some fundamental understanding of the ultrafast and efficient carrier transfer mechanism underneath HSs based on topological insulators.
机译：最近，基于拓扑绝缘体的异质结构（HSS）引起了巨大的研究兴趣，因为它们在金属表面状态诱导的异渗接近的有效载体转移特征。这里，提出了一种新的HS，包括0D PEROVSKITE CSPBBR3量子点（QDS）和2D材料拓扑绝缘体Bi2Se3膜，并实验研究。具体地，采用稳态和时间分辨的光致发光（PL）测量，从中观察到在HS中观察到显着的猝灭行为，平均猝灭因子为93.2 +/- 0.8％。另外，时间分辨的PL光谱证实，载流子转移效率可以高达92.6 +/- 0.2％。此外，0D-2D HS内的载波转移的动态通过利用FemtoSecond宽带瞬态吸收（TA）光谱，揭示从光屏蔽的CSPBBR3QD到Bi2Se3膜的超快激子转移，其时间尺度约为1.1 +/- 0.2 PS。另一种重要发现是，在HS的CSPBBR3 QD中展示了乐队重整化，其中主导因素是库仑筛选效果。这项工作有望在基于拓扑绝缘体的HSS下的超快和有效的载体转移机制提供一些基本的理解。

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  • 来源
    《Nanotechnology》 |2019年第32期|共7页
  • 作者

    Tang Yuxiang; Jiang Tian; Zhou Tong; Hao Hao; Wei Ke; Li Han; You Jie; Wang Zhenyu; Zheng Xin; Xu Zhongjie; Cheng Xiangai;

  • 作者单位

    Natl Univ Def Technol Coll Adv Interdisciplinary Studies Changsha 401173 Hunan Peoples R China;

    Natl Univ Def Technol Coll Adv Interdisciplinary Studies Changsha 401173 Hunan Peoples R China;

    Natl Univ Def Technol Coll Comp State Key Lab High Performance Comp Changsha 401173 Hunan Peoples R China;

    Natl Univ Def Technol Coll Comp State Key Lab High Performance Comp Changsha 401173 Hunan Peoples R China;

    Natl Univ Def Technol Coll Adv Interdisciplinary Studies Changsha 401173 Hunan Peoples R China;

    Natl Univ Def Technol Coll Adv Interdisciplinary Studies Changsha 401173 Hunan Peoples R China;

    Acad Mil Sci PLA China Natl Innovat Inst Def Technol Beijing 100010 Peoples R China;

    Acad Mil Sci PLA China Natl Innovat Inst Def Technol Beijing 100010 Peoples R China;

    Acad Mil Sci PLA China Natl Innovat Inst Def Technol Beijing 100010 Peoples R China;

    Natl Univ Def Technol Coll Adv Interdisciplinary Studies Changsha 401173 Hunan Peoples R China;

    Natl Univ Def Technol Coll Adv Interdisciplinary Studies Changsha 401173 Hunan Peoples R China;

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  • 正文语种 eng
  • 中图分类 特种结构材料;
  • 关键词

    topological insulator; perovskite; heterostructure; energy transfer; ultrafast measurement;

    机译：拓扑绝缘体;钙钛矿;异质结构;能量转移;超快测量;

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