首页> 外文期刊>Optics Letters >Fast automatic design method for freeform imaging systems through system construction and correction
【24h】

Fast automatic design method for freeform imaging systems through system construction and correction

机译:通过系统构建和校正的自由形式成像系统快速自动设计方法

获取原文
获取原文并翻译 | 示例
           

摘要

In traditional optical design, a starting point is selected and coefficients optimization is then performed using software. The process requires considerable time and the involvement of a human with design skills and experience. In this Letter, a fast automatic method for freeform imaging systems design is proposed. Using a plane system as the input, a freeform optical system with high image quality can be designed automatically at high speed. The method consists of system construction and system correction, combining the advantages of the direct design method and the methods based on aberration analysis. After system construction generates a system with fundamental optical parameters, system correction is an iterative process that alternates between image plane correction and surfaces correction to improve the image quality to a high level. Two examples required 5 min 56 s and 6 min 10 s to design freeform systems with near-diffraction-limit image quality. (C) 2020 Optical Society of America
机译:在传统光学设计中,选择起始点,然后使用软件执行系数优化。该过程需要相当长的时间和人类参与设计技能和经验。在这封信中,提出了一种快速的自动成像系统设计方法。使用平面系统作为输入,可以高速自动设计具有高图像质量的自由形式光学系统。该方法包括系统构造和系统校正,结合直接设计方法的优点和基于像差分析的方法。在系统构造产生具有基本光学参数的系统之后,系统校正是一种迭代过程,其在图像平面校正和表面校正之间交替,以将图像质量提高到高电平。需要5分56秒和6分10秒的两个例子设计具有近衍射极限图像质量的自由形式系统。 (c)2020美国光学学会

著录项

  • 来源
    《Optics Letters》 |2020年第18期|共4页
  • 作者单位

    Tsinghua Univ Dept Precis Instrument State Key Lab Precis Measurement Technol &

    Instru Beijing 100084 Peoples R China;

    Tsinghua Univ Dept Precis Instrument State Key Lab Precis Measurement Technol &

    Instru Beijing 100084 Peoples R China;

    Tsinghua Univ Dept Precis Instrument State Key Lab Precis Measurement Technol &

    Instru Beijing 100084 Peoples R China;

    Tsinghua Univ Dept Precis Instrument State Key Lab Precis Measurement Technol &

    Instru Beijing 100084 Peoples R China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 计量学;光学;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号