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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Reduced Artifact Approach for Determining Diffusion Coefficients in Time-Resolved Microscopy
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Reduced Artifact Approach for Determining Diffusion Coefficients in Time-Resolved Microscopy

机译:减少用于确定时间分辨显微镜的扩散系数的工件方法

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Ultrafast microscopy methods traditionally assume a Gaussian profile to extract excited state diffusivities from transport measurements. Although this fitting method recovers accurate diffusion coefficients when the point spread function is well-represented by a Gaussian, even minor spatial aberrations introduced by the imaging system cause significant errors in the determined value. To provide a more accurate measure of excited state transport in nano- and microscale materials systems, an alternative analysis protocol is proposed that numerically convolves the Green's function solution to the diffusion equation with the experimentally measured point spread function. In contrast to the Gaussian fitting approach, the numerical convolution is shown to be robust against artifacts caused by nonideal point spread functions. Furthermore, the numerical convolution approach is highly effective at resolving anisotropic diffusion in modeled data.
机译:超快显微镜方法传统上假设高斯型材以从运输测量中提取激发态扩散性。 尽管当Point扩展功能由高斯表示的点扩散函数是高斯表示的,但是也是由成像系统引入的次要空间像差甚至在所确定的值中引起显着的误差。 为了在纳米和微观材料系统中提供更准确的激发状态传输测量,提出了一种替代分析协议,以通过实验测量的点扩散功能来数值将绿色的功能解决方案旋转到扩散方程。 与高斯拟合方法相比,数值卷积被证明对由非去点扩展功能引起的伪影具有鲁棒。 此外,数值卷积方法在模拟数据中解析各向异性扩散方面是高效的。

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