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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Path-separated electron interferometry in a scanning transmission electron microscope
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Path-separated electron interferometry in a scanning transmission electron microscope

机译：扫描透射电子显微镜中的路径分离的电子干涉法

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摘要

We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30nm. We pass the +1 diffraction order probe through amorphous carbon while passing the 0th and -1 orders through vacuum. The probes arc then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.
机译：我们在扫描透射电子显微镜内报道了一种路径分离的电子干涉仪。在该设置中，我们使用纳米制造栅格作为幅度分割梁点，以制备多个空间分离的相干电子探针束。我们达到30nm的路径分离。通过真空通过0th和-1订单，通过非晶碳通过+1衍射阶探针。然后探头弧形弧形通过成像光学器件干扰，并且我们观察CCD检测器处的​​干涉图案，高达39.7％的条纹可见性。我们展示了初步实验结果，其中在测试阶段对象的衍射探针的1D扫描期间记录干涉图案。这些结果与通过独立测量标本厚度预测的建模干扰来定性地达成。该实验设计可能适用于相位对比成像和基本物理实验，例如电子波分组相干长度的探索。

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