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Effect of oxygen pressure on structure and ionic conductivity of epitaxial Li0.33La0.55TiO3 solid electrolyte thin films produced by pulsed laser deposition

机译:脉冲对脉冲激光沉积产生的外延Li0.331A0.55TiO3固体电解质薄膜结构和离子电导率的影响

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摘要

We report on the ionic conductivity of Li0.33La0.55TiO3 (LLTO) epitaxial films grown on the (100) and (111) surfaces of single crystal SrTiO3 (STO) substrates at different oxygen partial pressures (from 1.33 to 26.66 Pa). The films are intended for use as solid electrolytes for all-solid-state Li-ion batteries, and the epitaxial growth for modeling the electrolyte single crystal properties. The LLTO films overall exhibit formation of the perovskite-based orthorhombic structure with the epitaxial cube-on-cube orientation for both (100)(STO) and (111)(STO) substrates. Room temperature ionic conductivity of the LLTO films measured by impedance spectroscopy slightly decreases with the oxygen partial pressure changing from 1.33 to 26.66 Pa and is in the range of 10(-4) to 10(-5) S cm(-1). Complex impedance plots at different temperatures indicate that the conductivity in these epitaxial films is predominantly an intrinsic bulk property and exhibits distribution of relaxation time. Activation energies (E-a) for all the films were calculated employing the Arrhenius relationship and are between 0.30 eV and 0.40 eV, agreeing well with the reported values of bulk materials. Systematic difference in ionic conductivity between the (100)(STO) and (111)(STO) films is understood as being related to the difference in distribution of a "bottleneck" diffusion path. The measured conductivity of LLTO films indicates that these films can be used as a solid electrolyte in all-solid-state batteries.
机译:我们报告在不同氧气部分压力(从1.33至26.66Pa)的单晶SRTIO3(STO)基板的单晶SRTIO3(STO)基板的(111)表面上生长的Li0.33La0.55TiO3(LLTO)外延膜的离子电导率。该薄膜旨在用作全固态锂离子电池的固体电解质,以及用于对电解质单晶性能进行建模的外延生长。 LLTO薄膜总体表现出基于钙钛矿的正交结构的形成,其外延立方体对(STO)和(111)(STO)衬底具有外延立方体取向。通过阻抗光谱法测量的LLTO膜的室温离子电导率随从1.33至26.66Pa的氧分压略微降低,并且在10(-4)至10(-5)厘米(-1)的范围内。不同温度下的复杂阻抗图表明这些外延薄膜中的导电性主要是内在的散装性能,并且表现出松弛时间的分布。所有薄膜的激活能量(E-A)都是采用Arrhenius的关系计算,并且在0.30eV和0.40eV之间,同意散装材料的报告值。 (100)(STO)和(STO)和(STO)膜之间的离子电导率的系统差异被理解为与“瓶颈”扩散路径的分布差有关。 LLTO膜的测量导电性表明这些薄膜可以用作全固态电池中的固体电解质。

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  • 来源
    《RSC Advances》 |2016年第66期|共10页
  • 作者单位

    NIST Mat Measurement Lab Gaithersburg MD 20899 USA;

    NIST Mat Measurement Lab Gaithersburg MD 20899 USA;

    NIST Mat Measurement Lab Gaithersburg MD 20899 USA;

    NIST Mat Measurement Lab Gaithersburg MD 20899 USA;

    NIST Mat Measurement Lab Gaithersburg MD 20899 USA;

    Univ Maryland Dept Mat Sci &

    Engn College Pk MD 20742 USA;

    Univ Maryland Dept Mat Sci &

    Engn College Pk MD 20742 USA;

    NIST Mat Measurement Lab Gaithersburg MD 20899 USA;

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  • 正文语种 eng
  • 中图分类 化学;
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