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X-ray diagnostics of P-HEMT AlGaAs/InGaAs/GaAs structures

机译:P-HEMT AlGaAs / InGaAs / GaAs结构的X射线诊断

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摘要

The structural characteristics of the P-HEMT AlGaAs/InGaAs/GaAs heterostructure have been studied bv high-resolution X-ray diffractometry. The parameters of the heterostructure layers were determined by simultaneous analysis of the X-ray reflection curves for the (004) and ( 113) crystallographic planes. Inter- face diffusion has been established for the InyGa1-y. As quantum well and the Al-x,Ga1-x As spacer layer, which arc characterized by reconstructed profiles of the lattice parameter distribution and anisotropic distribution of random displacements in the layer plane and in the perpendicular direction.
机译:通过高分辨率X射线衍射法研究了P-HEMT AlGaAs / InGaAs / GaAs异质结构的结构特征。通过同时分析(004)和(113)晶面的X射线反射曲线来确定异质结构层的参数。已经为InyG​​a1-y建立了界面扩散。作为量子阱和Al-x,Ga1-x作为隔离层,其特征在于层平面和垂直方向上的随机位移的晶格参数分布和各向异性分布的重构轮廓。

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