Atomic force microscopy with fractal studies of temperature induced changes in the surface topography of polymeric materials

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Atomic force microscopy with fractal studies of temperature induced changes in the surface topography of polymeric materials

机译：原子力显微镜，具有聚合物材料表面形貌的温度诱导变化的分形研究

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Changes in the surface topography of polymeric materials can be analyzed to find the correspondence between observed surface features and specific external factors that might also influence physical and functional properties of the investigated material. In this work, atomic force microscopy (AFM) measurements were carried out to investigate the thermal changes in the surface topography as well as in the inner structure of the low density polyethylene (LDPE) samples subjected to 10 recirculations (rLDPE). For better assessment, fractal analysis and AFM results were additionally compared to DSC tests results.

机译：可以分析聚合物材料表面形貌的变化，以发现观察到的表面特征与特定外部因素之间的对应关系，这些外部因素也可能影响所研究的材料的物理和功能性质。在这项工作中，进行原子力显微镜（AFM）测量以研究表面形貌的热变化以及在经过10次重新加入（RLDPE）的低密度聚乙烯（LDPE）样品的内部结构中。为了更好地评估，另外与DSC测试结果另外进行分数分析和AFM结果。

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《Polimery》 |2020年第1期|共8页
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正文语种 eng
中图分类高分子化合物工业（高聚物工业）;
关键词
temperature; surface topography; polymeric materials; atomic force microscopy; fractal analysis; differential scanning calorimetry; low density polyethylene; recirculation;

机译：温度;表面形貌;聚合物材料;原子力显微镜;分形分析;差示扫描量热法;低密度聚乙烯;再循环;

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1. Atomic force microscopy with fractal studies of temperature induced changes in the surface topography of polymeric materials [J] . Polimery . 2020,第1期

机译：原子力显微镜，具有聚合物材料表面形貌的温度诱导变化的分形研究
2. Characterisation of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies [J] . Joseph N. Barisci, Rita Stella, Geoffrey M. Spinks, Electrochimica Acta . 2000,第4期

机译：电沉积导电聚合物薄膜的形貌和表面电势的表征使用原子力和电力显微镜
3. Quantified Differentiation of Surface Topography for Nano-materials As-Obtained from Atomic Force Microscopy Images [J] . Mousumi Gupta, Somenath Chatterjee Journal of Materials Engineering and Performance . 2018,第6期

机译：从原子力显微镜图像获得的纳米材料表面形貌的量化分化
4. Materials surface topography and composition imaging using dynamic atomic force microscopy [C] . Valentinas Snitka, Vida Mizariene, Arturas Ulcinas Smart Materials . 2001

机译：使用动态原子力显微镜对材料的表面形貌和成分成像
5. Measurement of van der Waals forces by atomic force microscopy between surfaces of silicon nitride, gold, and Langmuir-Blodgett films of polymerized 10,12-nonacosadiynoic acid. [D] . Myers, Ramona Lynn. 1999

机译：通过原子力显微镜在聚合的10,12-壬二芥子酸的氮化硅，金和Langmuir-Blodgett膜的表面之间测量范德华力。
6. Atomic force microscopy in vitro study of surface roughness and fractal character of a dental restoration composite after air-polishing [O] . Marco Salerno, Luca Giacomelli, Giacomo Derchi, 2010

机译：原子力显微镜体外抛光后牙科修复复合材料表面粗糙度和分形特征的研究
7. Surface Interaction Forces of Well-Defined, High-Density Polymer Brushes Studied by Atomic Force Microscopy (ORGANIC MATERIALS CHEMISTRY-Polymeric Materials) [O] . Tsujii Yoshinobu, Yamamoto Shinpei, Ejaz Muhammad, 2000

机译：原子力显微镜研究定义良好的高密度聚合物刷的表面相互作用力（有机材料化学-聚合物材料）

Atomic force microscopy with fractal studies of temperature induced changes in the surface topography of polymeric materials

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