Visualizing Stress and Temperature Distribution During Elevated Temperature Deformation of IN-617 Using Nanomechanical Raman Spectroscopy

Yang Zhang; Hao Wang; Vikas Tomar

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Visualizing Stress and Temperature Distribution During Elevated Temperature Deformation of IN-617 Using Nanomechanical Raman Spectroscopy

机译：使用纳米力学拉曼光谱法在-617升温期间可视化应力和温度分布

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Abstract This work presents direct measurements of stress and temperature distribution during the mesoscale microstructural deformation of Inconel-617 (IN-617) during 3-point bending tests as a function of temperature. A novel nanomechanical Raman spectroscopy (NMRS)-based measurement platform was designed for simultaneous in situ temperature and stress mapping as a function of microstructure during deformation. The temperature distribution was found to be directly correlated to stress distribution for the analyzed microstructures. Stress concentration locations are shown to be directly related to higher heat conduction and result in microstructural hot spots with significant local temperature variation.

机译：摘要本工作介绍了在3点弯曲试验期间Inconel-617（617 in-617）的Messcale微观结构变形期间应力和温度分布的直接测量。基于新颖的纳米机械拉曼光谱（NMRS）的测量平台被设计用于与变形过程中微观结构的函数的原位温度和应力映射。发现温度分布与分析的微观结构的应力分布直接相关。显示应力集中位置与较高的热传导直接相关，导致具有显着局部温度变化的微结构热点。

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《JOM》 |2018年第4期|共5页
作者
Yang Zhang; Hao Wang; Vikas Tomar;
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作者单位

School of Aeronautics and Astronautics Purdue University;

School of Aeronautics and Astronautics Purdue University;

School of Aeronautics and Astronautics Purdue University;

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原文格式 PDF
正文语种 eng
中图分类有色金属冶炼;金属学与金属工艺;
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1. Visualizing Stress and Temperature Distribution During Elevated Temperature Deformation of IN-617 Using Nanomechanical Raman Spectroscopy [J] . Yang Zhang, Hao Wang, Vikas Tomar JOM . 2018,第4期

机译：使用纳米力学拉曼光谱法在-617升温期间可视化应力和温度分布
2. Visualizing In Situ Microstructure Dependent Crack Tip Stress Distribution in IN-617 Using Nano-mechanical Raman Spectroscopy [J] . Zhang Yang, Mohanty Debapriya P., Tomar Vikas JOM . 2016,第11期

机译：使用纳米机械拉曼光谱法在617 in-617中的原位微结构依赖性裂纹尖端应力分布
3. Study of Near-Surface Stresses in Silicon Around Through-Silicon Vias at Elevated Temperatures by Raman Spectroscopy and Simulations [J] . Zhu Ye, Zhang Jiye, Li Hong Yu, Device and Materials Reliability, IEEE Transactions on . 2015,第2期

机译：用拉曼光谱和模拟研究高温下硅通孔周围硅中的近表面应力
4. Analyses of Nanoscale to Microscale Strength and Crack-Tip Stresses Using Nanomechanical Raman Spectroscopy in IN-617 [C] . Yang Zhang, Debapriya Pinaki Mohanty, Vikas Tomar SEM Annual Conference and Exposition on Experimental and Applied Mechanics . 2017

机译：用纳米力学拉曼光谱法分析纳米级对微尺寸强度和裂纹尖端应力的617
5. Studies of Nitrogen Vibrational Distribution Function and Rotational-Translational Temperature in Nonequilibrium Plasmas by Picosecond Coherent Anti-Stokes Raman Scattering Spectroscopy. [D] . Montello, Aaron David. 2012

机译：皮秒相干反斯托克斯拉曼散射光谱研究非平衡等离子体中的氮振动分布函数和旋转翻译温度。
6. Two flow stress models for describing hot deformation behavior of AISI-1045 medium carbon steel at elevated temperatures [O] . Mohanraj Murugesan, Dong Won Jung 2019

机译：用于描述AISI-1045中碳钢在高温下的热变形行为的两个流动应力模型
7. Study of Near-Surface Stresses in Silicon Around Through-Silicon Vias at Elevated Temperatures by Raman Spectroscopy and Simulations [O] . Ye Zhu, Jiye Zhang, Hong Yu Li, 2015

机译：拉曼光谱和模拟升高温度下硅通孔硅近表面应力研究

Visualizing Stress and Temperature Distribution During Elevated Temperature Deformation of IN-617 Using Nanomechanical Raman Spectroscopy

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