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首页> 外文期刊>Journal of optoelectronics and advanced materials >Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces
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Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces

机译:低热梯度Czochralski大MWO4(m = Zn,Cd)晶体的生长,以及(010)切割表面的微观结构和电子性质

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摘要

The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface.
机译:通过低热梯度Czochralski技术(LTG CZ)生长质量高达14(ZnWO4)和20(CDWO4)Kg的大型光学质量MWO4(M = Zn,Cd)晶体。 通过AFM和Rhef评估MWO4(010)切割表面的晶体性能,使用XPS研究表面的电子结构。 已经观察到kikuchi线的系统通过Rheed确认表面的高晶体质量来观察到切割的MWO4(010)。 已经测量了MWO4(010)的XPS价带和核心级光谱。 XPS测量揭示了W和M原子分别在切割的MWO4(010)表面上分别在正式的价值6+和2+中。

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