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首页> 外文期刊>Annual Review of Analytical Chemistry >Infrared Imaging and Spectroscopy Beyond the Diffraction Limit
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Infrared Imaging and Spectroscopy Beyond the Diffraction Limit

机译：超出衍射极限的红外成像和光谱学

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摘要

Progress in nanotechnology is enabled by and dependent on the availability of measurement methods with spatial resolution commensurate with nanomaterials' length scales. Chemical imaging techniques, such as scattering scanning near-field optical microscopy (s-SNOM) and photothermal-induced resonance (PTIR), have provided scientists with means of extracting rich chemical and structural information with nanoscale resolution. This review presents some basics of infrared spectroscopy and microscopy, followed by detailed descriptions of s-SNOM and PTIR working principles. Nanoscale spectra are compared with far-field macroscale spectra, which are widely used for chemical identification. Selected examples illustrate either technical aspects of the measurements or applications in materials science. Central to this review is the ability to record nanoscale infrared spectra because, although chemical maps enable immediate visualization, the spectra provide information to interpret the images and characterize the sample. The growing breadth of nanomaterials and biological applications suggest rapid growth for this field.
机译：纳米技术的进步取决于并依赖于空间分辨率与纳米材料的长度尺度相对应的测量方法的可用性。化学成像技术，例如散射扫描近场光学显微镜（s-SNOM）和光热诱导共振（PTIR），为科学家提供了提取具有纳米级分辨率的丰富化学和结构信息的方法。这篇综述介绍了红外光谱和显微镜的一些基础知识，然后详细介绍了s-SNOM和PTIR工作原理。将纳米光谱与远场宏观光谱进行了比较，后者广泛用于化学鉴定。所选示例说明了测量的技术方面或在材料科学中的应用。这项审查的中心是记录纳米级红外光谱的能力，因为尽管化学图可以立即显示，但光谱提供了解释图像和表征样品的信息。纳米材料和生物应用的广泛增长表明该领域的快速增长。

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