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Nanometer-scale lithography on microscopically clean graphene

机译:微观清洁石墨烯上的纳米级光刻

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摘要

Focused-electron-beam-induced deposition, or FEBID, enables the fabrication of patterns with sub-10nm resolution. The initial stages of metal deposition by FEBID are still not fundamentally well understood. For these investigations, graphene, a one-atom-thick sheet of carbon atoms in a hexagonal lattice, is ideal as the substrate for FEBID writing. In this paper, we have used exfoliated few-layer graphene as a support to study the early growth phase of focused-electron-beam-induced deposition and to write patterns with dimensions between 0.6 and 5nm. The results obtained here are compared to the deposition behavior on amorphous materials. Prior to the deposition experiment, the few-layer graphene was cleaned. Typically, it is observed in electron microscope images that areas of microscopically clean graphene are surrounded by areas with amorphous material. We present a method to remove the amorphous material in order to obtain large areas of microscopically clean graphene flakes. After cleaning, W(CO)_6 was used as the precursor to study the early growth phase of FEBID deposits. It was observed that preferential adsorption of the precursor molecules on step edges and adsorbates plays a key role in the deposition on cleaned few-layer graphene.
机译:聚焦电子束诱导沉积或FEBID可以制造分辨率低于10nm的图案。仍然没有从根本上了解通过FEBID进行金属沉积的初始阶段。对于这些研究,石墨烯是六原子晶格中单原子厚的碳原子片,是理想的FEBID写入基材。在本文中,我们使用了剥落的几层石墨烯作为支撑,以研究聚焦电子束诱导沉积的早期生长阶段,并编写了尺寸在0.6至5nm之间的图形。将此处获得的结果与在非晶材料上的沉积行为进行比较。在沉积实验之前,先清洁了几层石墨烯。通常,在电子显微镜图像中观察到,显微镜清洁的石墨烯区域被非晶态材料区域包围。我们提出了一种去除非晶态材料的方法,以便获得大面积的显微清洁石墨烯薄片。清洗后,将W(CO)_6用作研究FEBID沉积物早期生长阶段的前驱物。观察到前体分子在台阶边缘和被吸附物上的优先吸附在清洁的几层石墨烯上的沉积中起关键作用。

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