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Device performance of ferroelectric/correlated oxide heterostructures for non-volatile memory applications

机译:用于非易失性存储应用的铁电/相关氧化物异质结构的器件性能

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Ferroelectric field effect devices offer the possibility of non-volatile data storage. Attempts to integrate perovskite ferroelectric materials with silicon semiconductors, however, have been largely unsuccessful in creating non-volatile, nondestructive read memory elements because of difficulties in controlling the ferroelectric/semiconductor interface. Correlated oxide systems have been explored as alternative channel materials to form all-perovskite field effect devices. We examine a non-volatile memory using an electric-field- induced metal-insulator transition in PbZr_(0.2)Ti_(0.8)O _3/La_(1 - x)SrxMnO_3 (PZT/LSMO), PZT/La_(1 - x)Ca_xMnO_3 (PZT/LCMO) and PZT/La _(1 - x)Sr_xCoO_3 (PZT/LSCO) devices. The performance of these devices in the areas of switching time and retention are discussed.
机译:铁电场效应器件提供了非易失性数据存储的可能性。然而,由于难以控制铁电/半导体界面,因此将钙钛矿铁电材料与硅半导体集成的尝试在建立非易失性,非破坏性的读取存储元件方面一直未取得成功。已经探索了相关的氧化物体系作为形成全钙钛矿场效应器件的替代沟道材料。我们使用PbZr_(0.2)Ti_(0.8)O _3 / La_(1-x)SrxMnO_3(PZT / LSMO),PZT / La_(1-x )Ca_xMnO_3(PZT / LCMO)和PZT / La _(1- x)Sr_xCoO_3(PZT / LSCO)设备。讨论了这些器件在切换时间和保持能力方面的性能。

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