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InAs nanowires on Si substrates grown by solid source molecular beam epitaxy

机译:固体源分子束外延生长在Si衬底上的InAs纳米线

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摘要

Au-activated InAs nanowires were grown on Si substrates by solid source molecular beam epitaxy (SSMBE). Epitaxial growth of InAs nanowires turned out to be very sensitive to the surface condition of the Si substrates. InAs nanowires having a < 111 > growth direction, a high crystalline quality and a high aspect ratio over 300 with a uniform lateral size along the growth direction were grown using a high-temperature pre-annealing process in the MBE growth chamber to remove residual oxides from the surface of the Si substrates.
机译:通过固源分子束外延(SSMBE)在Si衬底上生长Au激活的InAs纳米线。事实证明,InAs纳米线的外延生长对Si衬底的表面状况非常敏感。使用高温预退火工艺在MBE生长室中生长具有<111>生长方向,高结晶质量和高纵横比且沿生长方向具有均匀横向尺寸的InAs纳米线,该InAs纳米线在MBE生长室中通过高温预退火工艺生长,以去除残留的氧化物,从而去除残留氧化物从Si衬底的表面开始。

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