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首页> 外文期刊>RSC Advances >Fabrication and characterization of nano-structured ZnS thin films as the buffer layers in solar cells
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Fabrication and characterization of nano-structured ZnS thin films as the buffer layers in solar cells

机译：纳米结构ZnS薄膜作为太阳能电池缓冲层的制备与表征

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High quality nanocrystalline ZnS thin films were deposited on glass substrates by a chemical bath deposition (CBD) method from an aqueous solution containing triethylamine, as a nontoxic complexing agent for zinc ions, at temperatures ranging from 50 to 90 degrees C. The effects of the deposition time and temperature on thickness as well as structural, morphological and optical properties of the ZnS thin films were examined by X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and ultraviolet-visible (UV-vis) spectroscopy. Fourier transform infrared spectroscopy (FT-IR) studies were done to investigate the presence of organic and/or other compounds in films. UV-vis spectroscopy data revealed the obtained ZnS films to have an optical band gap ranging from 4.1 to 3.9 eV. XRD results showed that the prepared films were highly crystalline with a cubic zinc blende structure consisting of very small nanocrystallites, 2.0-2.5 nm in size, showing quantum confinement effects.
机译：在50至90摄氏度的温度范围内，通过化学浴沉积（CBD）方法，从含有三乙胺（作为锌离子的无毒络合剂）的水溶液中，在玻璃基板上沉积高质量的纳米晶ZnS薄膜。通过X射线衍射（XRD），场发射扫描电子显微镜（FE-SEM）和紫外可见光（UV-vis）检查了ZnS薄膜的沉积时间和温度，厚度以及结构，形态和光学性质光谱学。进行了傅里叶变换红外光谱（FT-IR）研究，以研究薄膜中有机和/或其他化合物的存在。紫外可见光谱数据表明，所获得的ZnS膜具有4.1至3.9eV的光学带隙。 XRD结果表明，所制备的薄膜为高度结晶的立方锌混晶结构，由尺寸很小的2.0-2.5nm的纳米微晶组成，表现出量子约束效应。

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