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首页> 外文期刊>CERAMICS INTERNATIONAL >Improved accuracy of the measurements of indentation fracture resistance for silicon nitride ceramics by the powerful optical microscopy
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Improved accuracy of the measurements of indentation fracture resistance for silicon nitride ceramics by the powerful optical microscopy

机译：强大的光学显微镜提高了氮化硅陶瓷耐压痕断裂性能的测量精度

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Thirteen laboratories participated a round robin to investigate the reproducibility of indentation fracture resistance, K_(IFR), of silicon nitride ceramics. When the usual optical microscope with an object lens of ~10 × was employed for the crack-length measurements, K_(IFR) varied from 7.7 to 8.8 MPa m~(1/2), whereas those re-measured by authors using the measuring microscopy with an objective lens of 50 x exhibited a constant value of 7.5 ± 0.2 MPa m~(1/2). The inaccurate K_(IFR) of each laboratory was attributed mainly to the misreading of the crack length ~30 urn shorter. By contrast, powerful microscopy with both an object lens of 40 × and a traveling stage for the crack-length reading enabled each lab to measure more accurate K_(IFR) of 7.8 ± 0.3 MPa m~(1/2). The usefulness of the new measuring technique for the higher reliability of K_(IFR) was also confirmed for the Si_3N_4 ceramics just like those reported for SiC ceramics previously.
机译：13个实验室参加了循环试验，以研究氮化硅陶瓷抗压痕断裂强度K_（IFR）的可重复性。当使用物镜为约10×的普通光学显微镜进行裂纹长度测量时，K_（IFR）从7.7到8.8 MPa m〜（1/2）变化，而作者使用该测量方法对其进行了重新测量。物镜为50倍的显微镜显示的恒定值为7.5±0.2 MPa m〜（1/2）。每个实验室的K_（IFR）不准确，主要是由于对裂纹长度的误读短了约30 um。相比之下，强大的显微镜同时具有40倍物镜和用于裂缝长度读数的行进台，使每个实验室都可以测量7.8±0.3 MPa m〜（1/2）的更准确的K_（IFR）。就像以前报道的SiC陶瓷一样，对于Si_3N_4陶瓷也证实了新测量技术对于提高K_（IFR）的可靠性的有用性。

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