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Modelling of polarization charge-induced asymmetry of I-V characteristics of AlN/GaN-based resonant tunnelling structures

机译:极化电荷诱导的基于AlN / GaN的共振隧穿结构的I-V特性的不对称建模

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摘要

Numerical simulations of AlN/GaN-based resonant tunnelling diode structures are presented, employing self-consistent real-time Green's functions. The simulated current-voltage characteristics show strong asymmetry effects due to polarization charges at the heterointerfaces in the double-barrier region. [References: 2]
机译:提出了基于AlN / GaN的共振隧穿二极管结构的数值模拟,并采用了自洽的实时格林函数。由于双势垒区域中异质界面处的极化电荷,模拟的电流-电压特性显示出强烈的不对称效应。 [参考:2]

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