The capacitance, C, in interface-engineered junctions (IEJs) has been evaluated by comparing experimental hysteresis parameters (alpha (c)) with theoretical calculations based on an equivalent circuit model, in which the excess current incidental to Josephson junctions, made of high-temperature superconductors, is incorporated by a simple empirical formula. We have confirmed that the (alpha (c)) versus critical current (I-c) relationship observed for an IEJ, by varying the I-c value with an applied magnetic field, is reproduced well by the model. The analyses for a number of junctions have revealed that 1/C in IEJs scales approximately with log(I-c), reflecting a variation in the tunnel-barrier thickness among junctions. (C) 2001 Elsevier Science BY. All rights reserved. [References: 8]
展开▼
