Method for calibration of a lateral force in the AFM microscope and the device for calibration of a lateral force in the AFM microscope

• 1. 用于操纵显微镜中的光路的方法和装置、用于摄取显微镜中的图像堆栈的方法 [P] . 中国专利： CN111868575A . 2020-10-30
• 2. 晶格光片显微镜和在晶格光片显微镜中平铺晶格光片的方法 [P] . 中国专利： CN111103678A . 2020-05-05
• 3. METHOD OF LATERAL FORCE CALIBRATION IN AN AFM MICROSCOPE AND DEVICE FOR LATERAL FORCE CALIBRATION IN AN AFM MICROSCOPE [P] . 欧洲知识产权局专利： EP3361266A1 . 2018-08-15

  机译： AFM显微镜中的横向力校准方法及AFM显微镜中的横向力校准装置

• 4. Atomic force microscope (AFM) lateral force calibration [P] . 英国专利： GB2419952A . 2006-05-10

  机译： 原子力显微镜（AFM）横向力校准

• 5. Atomic force microscope (AFM) cantilever calibration [P] . 英国专利： GB2401945A . 2004-11-24

  机译： 原子力显微镜（AFM）悬臂校准

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• 9. Application and Progress in the Scanning Probe Microscopy. Development of Single Electron Devices Fabricated by Scanning Tunneling Microscope(STM)/Atomic Force Microscope(AFM). [O] . Jun-ichi SHIRAKASHI, Masami ISHII, Kazuhiko MATSUMOTO 1997

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