首页> 外国专利> METHOD FOR QUANTITATIVELY PROBING METAL ION WITHIN LIVING SINGLE CELL, AND NANOWIRE-BASED WAVEGUIDE PROBE FOR USE THEREIN

METHOD FOR QUANTITATIVELY PROBING METAL ION WITHIN LIVING SINGLE CELL, AND NANOWIRE-BASED WAVEGUIDE PROBE FOR USE THEREIN

机译：在单细胞内定量探测金属离子的方法及其基于纳米线的波导探针

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摘要

The present invention relates to the development of an active nanowire-based waveguide probe, and the quantitative probing of Cu²⁺ ions naturally present in living single neurons on the basis thereof. Specifically, the present invention allows intracellular Cu²⁺ ions to be quantitatively measured through the direct observation of photoluminescence (PL) quenching by the Cu²⁺ ions within the nanowire by inserting a nanowire waveguide probe into living single cells.

机译：本发明涉及基于有源纳米线的波导探针的开发，并基于该探针对天然存在于活的单个神经元中的Cu ^{2 + 离子进行定量探测。具体地，本发明允许通过直接观察通过插入纳米线内的Cu ^{2 + 离子对光致发光（PL）淬灭的方法来定量测量细胞内Cu ^{2 + 离子。纳米线波导探针进入活细胞。}}}

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公开/公告号WO2017155283A1

专利类型
公开/公告日2017-09-14

原文格式PDF
申请/专利权人 POSTECH ACADEMY-INDUSTRY FOUNDATION;
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申请/专利号WO2017KR02458
发明设计人 JE JUNG HO;LEE JUN HO;
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申请日2017-03-07
分类号G01N21/85;G01N33/487;G01N33/20;G02B6/10;
国家 WO
入库时间 2022-08-21 13:29:51

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