METHOD OF PERFORMING SINGLE EVENT UPSET TESTING

• 1. 对单个硬盘进行混合压力测试的方法、系统、设备及介质 [P] . 中国专利： CN111427756A . 2020-07-17
• 2. 用于以单个矢量信号分析仪进行同时MIMO信号测试的系统和方法 [P] . 中国专利： CN103493410A . 2014-01-01
• 3. Method of performing single event upset testing [P] . US10956265B2 . 2021-03-23

  机译： 执行单一事件镦锻测试的方法

• 4. Single event upset (SEU) testing system and method [P] . 美国专利： US2010163756A1 . 2010-07-01

  机译： 单事件失败（SEU）测试系统和方法

• 5. SINGLE EVENT UPSET TEST CIRCUIT AND METHODOLOGY [P] . 欧洲知识产权局专利： EP2067049B1 . 2012-08-29

  机译： 单事件上测试电路和方法

• 1. Development of Contactless Method of the DUT Heating during Single-Event Effect Tests [J] . Vasily S.Anashin, Eugeny V.Mitin, Aleksandr E.Koziukov, 物理科学与应用：英文版 . 2018,第002期
• 2. Geant4 Simulation of Neutron-induced Single Event Upset in a Three Dimension Die-stacked SRAM [J] . Mo Lihua, Ye Bing, Liu Jie, 中国科学院近代物理研究所和兰州重离子研究装置年报：英文版 . 2019,第001期
• 3. Heavy ion-induced single event upset sensitivity evaluation of 3D integrated static random access memory [J] . Xue-Bing Cao, Li-Yi Xiao, Ming-Xue Huo, 核技术（英文版） . 2018,第003期
• 4. Experimental study of temperature dependence of single-event upset in SRAMs [J] . Li Cai, Gang Guo, Jian-Cheng Liu, 核技术（英文版） . 2016,第001期
• 5. A novel single event upset reversal in 40-nm bulk CMOS 6 T SRAM cells [J] . 李鹏, 张民选, 赵振宇, 核技术（英文版） . 2015,第005期
• 6. Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter [J] . Kruckmeyer K., Rennie R.L., Ramachandran V. IEEE Transactions on Nuclear Science . 2008,第4期
• 7. Single Event Upset tests and failure rate estimation for a front-end ASIC adopted in high-flux-particle therapy applications [J] . Fausti F., Mazza G., Giordanengo S., Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment . 2019,第FEBa21期
• 8. Influence of Laser Pulse Duration in Single Event Upset Testing [J] . Douin A., Pouget V., Darracq F., IEEE Transactions on Nuclear Science . 2006,第4期
• 9. Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method [C] . Kruckmeyer, Kirby, Rennie, . 2007
• 10. Pattern identification of multiple cell upsets in static random access memories: A correlation of experimental test results to single event upset mechanisms. [D] . Black, Jeffrey D. 2008
• 11. Improving Ebola infection prevention and control in primary healthcare facilities in Sierra Leone: a single-group pretest post-test mixed-methods study [O] . Ruwan Ratnayake, Lara S Ho, Rashid Ansumana, 2016
• 12. Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter [O] . Kirby Kruckmeyer, Robert L. Rennie, Vishwanath Ramach 2012

• 1. 机场噪声监测方法研究——以单个飞行事件测量为例 [C] . 许漂致 ,高琼 ,程炯 . 中国环境科学学会2019年学术年会 . 2019
• 2. 激光显微切割从组织切片中提取单个细胞进行PCR的方法探讨 [A] . 张玉华 . 2005