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FLASH MEMORY STORAGE DEVICE CAPABLE OF VERIFYING RELIABILITY BY USING A BYPASS PATH, A SYSTEM AND A METHOD FOR VERIFYING THE RELIABILITY OF THE FLASH MEMORY STORAGE DEVICE
FLASH MEMORY STORAGE DEVICE CAPABLE OF VERIFYING RELIABILITY BY USING A BYPASS PATH, A SYSTEM AND A METHOD FOR VERIFYING THE RELIABILITY OF THE FLASH MEMORY STORAGE DEVICE
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机译：能够通过旁路路径来验证可靠性的闪存存储设备，用于验证闪存存储设备可靠性的系统和方法
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摘要
PURPOSE: A flash memory storage device capable of verifying reliability by using a bypass path, a system and a method for verifying the reliability of the flash memory storage device are provided to objectively verify the reliability of a completely developed result.;CONSTITUTION: A controller(101) controls a flash memory chip. A first connector(102) is formed for a first path between the flash memory chip and the controller. A second connector(103) is formed for a second path between the controller and a test support system to test a flash memory storage device. The controller selectively activates the first path or the second path.;COPYRIGHT KIPO 2013;[Reference numerals] (100) Flash memory storage device; (101) Controller; (104) Flash memory chip; (110) Test support system; (130) Host; (140) Host interface;
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