首页> 外文会议>3rd International Workshop on Microfactories Sep 16-18, 2002 Minneapolis, Minnesota USA >APPLICATION OF SPM TECHNOLOGY FOR POSITION SENSING IN MICRO-NANO ROBOTICS
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APPLICATION OF SPM TECHNOLOGY FOR POSITION SENSING IN MICRO-NANO ROBOTICS

机译:SPM技术在微纳米机器人中的位置传感应用

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摘要

A novel position sensor based on atomic force microscope (AFM) and nanometric scale reference is presented. The scale reference is fixed to the object whose position is to be measured and the AFM to the reference frame or vice versa. The AFM tip is brought in proximity to the scale and relative displacement is determined by counting the number of periods in the AFM signal. A compact and potentially low cost AFM called the Credit Card AFM (CCAFM) has been developed to serve as the sensor head of the position sensing system. 1-d and 2-d nano gratings are used as scale reference. Monolithic piexo XY stages and electromagnetic linear XY stages are used as test platforms.
机译:提出了一种基于原子力显微镜(AFM)和纳米尺度参考的新型位置传感器。标尺参考固定到要测量其位置的对象,AFM固定到参考框架,反之亦然。使AFM尖端靠近刻度尺,并通过对AFM信号中的周期数进行计数来确定相对位移。已经开发出一种称为信用卡AFM(CCAFM)的紧凑型且价格可能较低的AFM,用作位置感应系统的传感器头。一维和二维纳米光栅用作比例参考。单片压电XY平台和电磁线性XY平台用作测试平台。

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