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Mix and match of nanoimprint and UV lithography

机译:纳米压印和UV光刻的混合搭配

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摘要

Extensive work has been done in recent years to establish nanoimprint lithography (NIL) as a low-cost technology for nanometer-scaled resist pattern definition. Investigations have revealed that creating of small and periodic nanometer-scaled patterns adjacent to larger patterns is difficult due to the flow behaviour of the resist material. In this paper mix and match of NIL and UV lithography is proposed to solve this problem and moreover to attain profiled structures within one coating. A chemically amplified broadband negative tone photoresist based on SU-8 is used to realize this idea.
机译:近年来,已经进行了广泛的工作来建立纳米压印光刻(NIL),这是一种用于纳米级抗蚀剂图案定义的低成本技术。研究表明,由于抗蚀剂材料的流动特性,难以在大图案附近形成小且周期性的纳米级图案。在本文中,提出了NIL和UV光刻的混合搭配以解决该问题,并且在一个涂层内获得异型结构。使用基于SU-8的化学放大的宽带负性光致抗蚀剂来实现这一想法。

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