首页> 外文会议>Conference on Soft X-Ray Lasers and Applications V; Aug 6-7, 2003; San Diego, California, USA >New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality
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New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality

机译:测量X射线束或X射线光学器件质量的新技术

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Metrology of XUV beams and more specifically X-ray laser (XRL) beam is of crucial importance for development of applications. We have then developed several new optical systems enabling to measure the x-ray laser optical properties. By use of a Michelson interferometer working as a Fourier-Transform spectrometer, the line shapes of different x-ray lasers have been measured with an unprecedented accuracy (δλ/λ~10~(-6)). Achievement of the first XUV wavefront sensor has enable to measure the beam quality of laser-pumped as well as discharge pumped x-ray lasers. Capillary discharge XRL has demonstrated a very good wavefront allowing to achieve intensity as high 3*10~(14) Wcm~(-2) by focusing with a f = 5 cm mirror. The measured sensor accuracy is as good as λ/120 at 13 nm. Commercial developments are under way.
机译:XUV光束,尤其是X射线激光(XRL)光束的计量对于开发应用至关重要。然后,我们开发了几种新的光学系统,可以测量X射线激光的光学特性。通过将迈克尔逊干涉仪用作傅立叶变换光谱仪,以前所未有的精度(δλ/λ〜10〜(-6))测量了不同X射线激光的线形。第一个XUV波前传感器的成就使得能够测量激光泵浦和放电泵浦X射线激光器的光束质量。毛细管放电XRL表现出非常好的波前效果,通过使用f = 5 cm镜聚焦,可以实现高达3 * 10〜(14)Wcm〜(-2)的强度。在13 nm处测得的传感器精度达到λ/ 120。商业发展正在进行中。

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