首页> 外文会议>Conference on photomask and next-generation lithography mask technology >Advanced e-beam reticle writing system for next generation reticle fabrication
【24h】

Advanced e-beam reticle writing system for next generation reticle fabrication

机译:用于下一代掩模版制造的高级电子束掩模版写入系统

获取原文

摘要

In this paper, the key features and results of the new advanced electron beam (e-beam) reticle writing system HL-900M are shown. This new system, based on HL-800M technology~(1)-3)), has been improved from the both sides of hardware and software with introducing some new technologies. The new electron beam optical column has been introduced to keep enough stability against environmental fluctuations. X-Y stage mechanism and high precision temperature control system have been refreshed to promise highly positioning accuracy. Parallel processing exposure function maskes throughput improved even with handling the huge amount of data, such as over 20 Gbytes in the standard specification system.
机译:本文展示了新型先进电子束(e-beam)标线写入系统HL-900M的关键特性和结果。该新系统基于HL-800M技术((1)-3)),通过引入一些新技术从硬件和软件两方面进行了改进。引入了新的电子束光学柱,以保持足够的稳定性以抵抗环境波动。 X-Y平台机构和高精度温度控制系统已更新,以保证高度的定位精度。即使处理大量数据(例如,在标准规格系统中超过20 GB),并行处理曝光功能也可以提高吞吐量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号