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Test Generation for Crosstalk Glitches Considering Multiple Coupling Effects

机译：考虑多种耦合效应的串扰故障的试验

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摘要

As the feature size continues to scale into the nanometer era, crosstalk-induced effect begins to exert a more significant influence. In this paper, we address the condition of maximum crosstalk glitch noise considering multiple coupling effects and propose a novel test generation technique for this problem. A multiple crosstalk-induced glitch fault (MCGF) model is introduced, which gives information on one or more sub-paths to be sensitized to generate transitions coupled to a victim line. The test for an MCGF is a 2-vector pattern that sensitizes the transition signal along the sub-path to each aggressor line at the maximum aggressive time (MAT), and propagates the signal on a victim line to an output. A new structure, transition map (TM), is proposed to record all the possible arrival time of a line. The MAT of a victim line is calculated based on effective coupling capacitance (ECC). Therefore, the crosstalk-induced effects can be effectively identified, and exactly activated using the generated test patterns. Experiments on ISCAS89 benchmark circuit show that the proposed technique can be applied to circuits of reasonable sizes within acceptable time.
机译：随着特征大小继续扩展到纳米时代，串扰诱导的效果开始发挥更大的影响。在本文中，我们解决了考虑多种耦合效应的最大串扰毛孔噪声的条件，并提出了一种新的测试生成技术。介绍了多个串扰引起的毛刺故障（MCGF）模型，其提供有关一个或多个子路径的信息，以产生耦合到受害线的转变。 MCGF的测试是2矢量模式，其在最大辐射时间（垫）处的每个攻击线的子路径沿着子路径敏感，并将信号传播到受害线上的输出。建议新的结构转换映射（TM），以记录线路的所有可能的到达时间。基于有效耦合电容（ECC）计算受害管线垫。因此，可以使用产生的测试模式有效地识别串扰诱导的效果，并恰好激活。 ISCAS89基准电路的实验表明，所提出的技术可在可接受的时间内应用于合理尺寸的电路。

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