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Test Generation for Crosstalk Glitches Considering Multiple Coupling Effects

机译：考虑多重耦合效应的串扰毛刺的测试生成

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摘要

As the feature size continues to scale into the nanometer era, crosstalk-induced effect begins to exert a more significant influence. In this paper, we address the condition of maximum crosstalk glitch noise considering multiple coupling effects and propose a novel test generation technique for this problem. A multiple crosstalk-induced glitch fault (MCGF) model is introduced, which gives information on one or more sub-paths to be sensitized to generate transitions coupled to a victim line. The test for an MCGF is a 2-vector pattern that sensitizes the transition signal along the sub-path to each aggressor line at the maximum aggressive time (MAT), and propagates the signal on a victim line to an output. A new structure, transition map (TM), is proposed to record all the possible arrival time of a line. The MAT of a victim line is calculated based on effective coupling capacitance (ECC). Therefore, the crosstalk-induced effects can be effectively identified, and exactly activated using the generated test patterns. Experiments on ISCAS89 benchmark circuit show that the proposed technique can be applied to circuits of reasonable sizes within acceptable time.
机译：随着特征尺寸继续扩展到纳米时代，串扰引起的影响开始发挥更大的影响。在本文中，我们考虑了多重耦合效应，解决了最大串扰毛刺噪声的情况，并针对该问题提出了一种新颖的测试生成技术。引入了多重串扰引起的毛刺故障（MCGF）模型，该模型给出了有关一个或多个子路径的信息，这些子路径将被敏感以生成耦合到受害线路的过渡。 MCGF的测试是2矢量模式，该模式会在最大激进时间（MAT）时使沿子路径的转换信号敏感到每条攻击线，并将信号在受害线上传播到输出。提出了一种新结构，过渡图（TM），以记录一条线的所有可能到达时间。根据有效耦合电容（ECC）计算受害线的MAT。因此，可以有效地识别出串扰引起的影响，并使用生成的测试模式准确激活。在ISCAS89基准电路上进行的实验表明，该技术可以在可接受的时间内应用于尺寸合理的电路。

著录项

  • 来源
    《16th Asian Test Symposium》|2007年|259-264|共6页
  • 会议地点 Beijing(CN);Beijing(CN)
  • 作者

    JIAO Ming-lian; rnJIANG Ting-chen; rnZONG Yu-yu;

  • 作者单位

    Minjin Zhang@Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China Graduate School of Chinese Academy of Sciences, Beijing, China--Xiaowei Li@Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China--;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 调整、测试;
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