We demonstrate Magnetic Force Microscopy (MFM) imaging,at room temperature in air,of a 0.25 mA DC current path in a 140nm-wide gold nanowire.The nanowire was created by focused ion beam milling of a 12mum wide Cr/Au line of 20nm/110nm Cr/Au thickness.Iterative fitting of the MFM data to an idealized model of the structure yielded a nanowire resistivity a factor of 3.5 higher than that of a control Cr/Au region which was unaffected by the ion beam processing.MFM imaging of an ion-implant patterned line shows current deflection around the implant region.
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