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Wafer-scale oxide fusion bonding and wafer thinning development for 3D systems integration: Oxide fusion wafer bonding and wafer thinning development for TSV-last integration

机译:3D系统集成晶圆型氧化物融合粘接和晶圆减薄开发:氧化物融合晶圆键合和TSV - 最后一体集成的晶圆减薄开发

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摘要

300mm Si wafer-scale oxide fusion bonding and mechanical/wet etch assisted wafer thinning processes were combined with a TSV-last 3D integration strategy to fabricate electrical open/short yield learning on through-wafer electrical TSV test chains.
机译:300mm Si晶片型氧化物熔接和机械/湿蚀刻辅助晶片稀释工艺与TSV-Last 3D集成策略合并,以制造通过晶圆电TSV检测链的电开/短收益率。

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